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IEEE contains articles, standards and conference papers from IEEE journals.
IEEE Xplore contains the full text of all IEEE & IET conference papers, and standards published since 1988 and all IEEE journals since 1884 & IET journals since 1988. The material can be accessed through a searchable database or by browsing. 100 concurrent users. Inactive users timeout after 15 minutes.
Journal articles from technical and scientific sources related to electronics, physics, control engineering and more.
Inspec is a leading bibliographic information database covering the fields of physics, electronics, computing, control engineering and information technology with more than 7.7 million records taken from 3,500 technical and scientific journals and 1,500 conference proceedings. Coverage: 1896-present.
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